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Norm

ISO 9220:2022

Issue date: 2022 02 11

Metallic coatings — Measurement of coating thickness — Scanning electron microscope method

This document specifies a destructive method for the measurement of the local thickness of metallic and other inorganic coatings by examination of cross-sections with a s...
Valid

This document specifies a destructive method for the measurement of the local thickness of metallic and other inorganic coatings by examination of cross-sections with a scanning electron microscope (SEM). The method is applicable for thicknesses up to several millimetres, but for such thick coatings it is usually more practical to use a light microscope (see ISO 1463). The lower thickness limit depends on the achieved measurement uncertainty (see Clause 10).

NOTE       The method can also be used for organic layers when they are neither damaged by the preparation of the cross-section nor by the electron beam during imaging.

ISO 9220:2022
2022 02 11
Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
Norm
ISO 9220:1988
1988 09 29
Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
Norm