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Norm
ISO 9220:1988
Issue date: 1988 09 29
Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive ...
Withdrawn: 2022 02 11
Publisher:
International Organization for Standardization
Format:
Digital | 5 Pages
Language:
English
Currently valid:
ICS
Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /um, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a ligth microscope (ISO 1463). Annex a gives the preparation of cross-sections.
ISO 9220:2022
2022 02 11
Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
Norm
ISO 9220:1988
1988 09 29
Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
Norm
↖
Norm
Issue date :
2022 02 11
Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
