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Norm

ISO 3497:2000

Issue date: 2000 12 21

Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods

Valid
ISO 3497:2000
2000 12 21
Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods
Norm
ISO 3497:1990
1990 11 08
Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods
Norm
ISO 3497:1976
1976 02 01
Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods
Norm