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Norm
IEC 60060-3:1976 Ed. 1.0
Issue date: 1976 01 01
High-voltage test techniques - Part 3: Measuring devices
Applies to devices and complete systems, other than sphere-gaps, used for the measurement of voltages and currents during dielectric tests with direct voltage, alternatin...
Withdrawn: 1994 11 23
Publisher:
International Electrotechnical Commission
Format:
Digital | 21 Pages
Language:
English
Currently valid:
Applies to devices and complete systems, other than sphere-gaps, used for the measurement of voltages and currents during dielectric tests with direct voltage, alternating voltage, lightning and switching impulse voltages and for tests with high-impulse currents. Voltage measurements with sphere-gaps are dealt with in IEC 52. Gives guidance concerning the quantities to be measured, accuracies required and requirements of measuring systems.
IEC 60060-3:2006 Ed. 1.0
2006 02 07
High-voltage test techniques - Part 3: Definitions and requirements for on-site testing
Norm
IEC 60060-2:1994/AMD1:1996 Ed. 2.0
1996 03 13
Amendment 1 - High voltage test techniques - Part 2: Measuring systems
Norm
Norm
Issue date :
1994 11 23
High voltage test techniques - Part 2: Measuring systems
Norm
Issue date :
2006 02 07
High-voltage test techniques - Part 3: Definitions and requirements for on-site testing
