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Norm

OVE EN IEC 60749-30

Issue date: 2023 03 01

Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing ((IEC 60749-30:2020) EN IEC 60749-30:2020) (english version)

Valid
Publisher:
Österreichischer Verband für Elektrotechnik
Format:
Digital | 36 Pages
Language:
English
ICS
31.080.01
Topics
IT, communication & electronic, Electronic components, Semiconductor devices in general
OVE EN IEC 60749-30
2023 03 01
Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-her...
Norm
↖
ÖVE/ÖNORM EN 60749-30
2012 02 01
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-herme...
Norm
ÖVE/ÖNORM EN 60749-30
2012 02 01
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-herme...
Norm
ÖVE/ÖNORM EN 60749-30
2005 07 01
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-herme...
Norm
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